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Research Grade Duel Head Microscope Face to Face- Model MVM-2 FTF
Dual Head Binocular Microscope:- 45 Degree Inclined Dual Binocular Heads.Adjusts to the Distance Between your Eyes: 55 to 75mm Interpupillary Distance Diopter Adjustment on Both Oculars of Each Scope Head to Correct for Your Specific Vision Needs. Coaxial Fine and Coarse Focusing Knobs on Both Sides of Microscope. Coarse Adjustment Travel Range: 25mm (Stage Movement Distance Up/Down). Fine Adjustment Division: 0.002mm. Tension Adjustable Coarse focusing. Large Graduated Double Layer Low Drive Co-axial Mechanical, traveling on ball guides for smooth movement of slide. 1.25 N.A.Abbes Sub stage Condenser, Variable 6V/20W Halogen Transmitted Base Illumination with following optics:-
Eyepiece: Wide Field 10x.
Objectives: 4x, 10x, 40x, 100x oil
Description
Description
The Research Grade Dual Head Microscope, Model MVM-2 FTF, you may explore the fascinating world of microscopy. This cutting-edge tool was painstakingly created for use in scientific research, educational settings, and industrial settings where clarity and precision are critical.
Dual optical paths on the Model MVM-2 FTF enable two observers to see specimens in real time at the same time. This feature improves teamwork and learning environments by enabling in-depth observations and conversations without the need for extra hardware.
With its top-notch optics, which include wide-field eyepieces and plan achromatic objectives, the microscope offers remarkable color fidelity, clarity, and resolution. It can accommodate a wide range of specimen types, from complex industrial components to biological samples, with a magnification range of typically 40x to 1000x.
For ergonomic viewing for people of all ages, each viewing head is equipped with cozy binocular eyepieces that can be adjusted to suit various interpupillary distances. Additionally, the microscope has a dual halogen illumination system with intensity settings that may be adjusted. This system provides bright, steady illumination that is necessary for examining specimens with different levels of transparency and reflectivity.
